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发表于 2015-12-15 11:50
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% |1 A3 G3 ? I9 \. X$ P谢谢,我还碰到插拔USB导致PMU烧毁的情况,厂商分析为EOS原因:
, ]6 N2 G$ }+ g& x9 o(1) By ATE test program, short failure was detected on these returned samples.
7 J' {( Q! O+ s. H; s2 m3 [(2) From X-ray analysis, no obvious abnormality was observed on these samples.
" }( I( A/ T: L0 a# c6 K* s2 H(3) From de-cap analysis, obvious chip burned was observed on these samples.
/ l Z9 ~- n# V' \: k(4) Based on above analysis, we think EOS could be the root cause to result in chip damaged of these returned samples.
3 m) g" q* |1 f# u( V- x: y, E! F. u9 ^$ A1 G+ L& j- c) _
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