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发表于 2015-12-15 11:50
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& n) Z' U/ S+ o, b0 g5 O" ^谢谢,我还碰到插拔USB导致PMU烧毁的情况,厂商分析为EOS原因:6 p$ V- a8 C) _: t& t
(1) By ATE test program, short failure was detected on these returned samples.0 x. r/ W; d2 v! W _
(2) From X-ray analysis, no obvious abnormality was observed on these samples.
8 T) g% U+ g) V. N/ W(3) From de-cap analysis, obvious chip burned was observed on these samples.
1 H0 y9 k3 E1 }% N# Q7 H(4) Based on above analysis, we think EOS could be the root cause to result in chip damaged of these returned samples. K5 n* V/ `: M$ Q/ Q
# N# q( d, n4 h! J/ y
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