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发表于 2015-12-15 11:50
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谢谢,我还碰到插拔USB导致PMU烧毁的情况,厂商分析为EOS原因:
% C. \2 f1 ?! B+ Y2 n(1) By ATE test program, short failure was detected on these returned samples.
1 H' ]% H, ?+ i" P! _(2) From X-ray analysis, no obvious abnormality was observed on these samples.1 t% g) G( O( }, e
(3) From de-cap analysis, obvious chip burned was observed on these samples., z; I! G3 g2 [( f
(4) Based on above analysis, we think EOS could be the root cause to result in chip damaged of these returned samples.; t! S0 f% D; v
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