|
推荐
楼主 |
发表于 2015-12-15 11:50
|
只看该作者
$ z8 [( ?1 v4 E4 s" C3 s谢谢,我还碰到插拔USB导致PMU烧毁的情况,厂商分析为EOS原因:
" @3 O9 b6 T$ w5 \(1) By ATE test program, short failure was detected on these returned samples.: C8 E$ N! c3 }& O- T
(2) From X-ray analysis, no obvious abnormality was observed on these samples.
/ ~2 v2 q1 I$ ^# ]3 |) z0 y(3) From de-cap analysis, obvious chip burned was observed on these samples.7 S ?5 N# D* K! F% r& Q1 f
(4) Based on above analysis, we think EOS could be the root cause to result in chip damaged of these returned samples.
! g# B i3 i( N; y/ `5 S; T f" q) x' ?6 w
|
|