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发表于 2015-12-15 11:50
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3 J5 r7 P- D: d* I+ `" M. A/ ^谢谢,我还碰到插拔USB导致PMU烧毁的情况,厂商分析为EOS原因:
. t# N, G( o+ N& t& a2 S% i(1) By ATE test program, short failure was detected on these returned samples.
& u7 x) _$ l0 ?/ l: C3 J(2) From X-ray analysis, no obvious abnormality was observed on these samples.8 M' P" i; V1 L
(3) From de-cap analysis, obvious chip burned was observed on these samples.
4 z( [/ [1 V3 K& {. ](4) Based on above analysis, we think EOS could be the root cause to result in chip damaged of these returned samples.1 o' o, Q8 E9 o6 S# N
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