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哪位朋友有以下这些文章的pdf文档?: i$ }5 e. b ~5 L3 V
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C. Morgan, “Solutions for Causal Modeling and a Technique for Measuring, Causal, Broadband Dielectric Properties,” DesignCon 2008. P) d$ _4 D* o1 u/ R" f9 \5 e
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E. Bogatin, D. DeGroot, C. Warwick, S. Gupta, “Frequency Dependent Material Properties: So What?” 7-TA1, DesignCon 2010
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& H4 C) H9 r; lD. Degroot, P. Pupalaikis, B. Shumaker, “Total Loss: How to Qualify Circcuit Boards”, DesignCon 20117 e R: j+ i' M0 B( M0 ?
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# Q! s) q. k% |8 tA. Rajagopal, B. Achkir, M. Koledintseva, A. Koul, J. Drewniak, “Material Parameter Extraction Using Time-Domain TRL (t-TRL) Measurements”, 978-1-4244-4267, IEEE EMC 2009
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6 h) U1 Z# n3 f0 [- l9 CA. Horn, J. Reynolds, J. Ratio, “Conductor Profile Effects on the Propagation Constant of Microstrip Transmission Lines”, IEEE IMS 2010
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' H2 O5 ]: |6 c OH. Barnes, J. Moreira, M. Resso and R. Schaefer, “Advances in ATE Fixture Performance and Socket Characterization for Multi-Gigabit Applications”, DesignCon 2012, a- @& O) ^7 |1 z7 G( J5 P( _
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R. Schaefer, “Comparison of Fixture Removal Techniques for Connector and Cable Measurements” Signal Integrity Workshop, IMS 2010
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A.R. Djordjevic, R.M. Biljic, V.D. Likar-Smiljanic, and T.K. Sarkar, “Wideband Frequency-Domain Characterization of FR-4 and Time-Domain Causality,” IEEE Transactions on Electromagnetic Compatibility, vol. 43, no. 4, November 2001% E- |# ?' `+ t, |7 }
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