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哪位朋友有以下这些文章的pdf文档?6 n9 ~3 Z, r i4 j& |
) r8 w9 E1 r& f8 w) q' K4 dC. Morgan, “Solutions for Causal Modeling and a Technique for Measuring, Causal, Broadband Dielectric Properties,” DesignCon 2008& j" n. U6 F2 Z1 H$ Z. }" c% i
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E. Bogatin, D. DeGroot, C. Warwick, S. Gupta, “Frequency Dependent Material Properties: So What?” 7-TA1, DesignCon 2010+ p4 u! f: n: c I
! b* E7 _. f4 z; P! ^ ED. Degroot, P. Pupalaikis, B. Shumaker, “Total Loss: How to Qualify Circcuit Boards”, DesignCon 2011# h" L1 Y' L- O. Z* m$ Y" X3 w
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A. Rajagopal, B. Achkir, M. Koledintseva, A. Koul, J. Drewniak, “Material Parameter Extraction Using Time-Domain TRL (t-TRL) Measurements”, 978-1-4244-4267, IEEE EMC 2009' J/ d; F" K% }5 _" w$ Q/ c
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A. Horn, J. Reynolds, J. Ratio, “Conductor Profile Effects on the Propagation Constant of Microstrip Transmission Lines”, IEEE IMS 2010) i+ D( h, \) F' t! k
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H. Barnes, J. Moreira, M. Resso and R. Schaefer, “Advances in ATE Fixture Performance and Socket Characterization for Multi-Gigabit Applications”, DesignCon 2012
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R. Schaefer, “Comparison of Fixture Removal Techniques for Connector and Cable Measurements” Signal Integrity Workshop, IMS 2010
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2 ]. K/ B5 H& g: A( V; lA.R. Djordjevic, R.M. Biljic, V.D. Likar-Smiljanic, and T.K. Sarkar, “Wideband Frequency-Domain Characterization of FR-4 and Time-Domain Causality,” IEEE Transactions on Electromagnetic Compatibility, vol. 43, no. 4, November 2001% V) A: S7 D; {- T# |
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