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哪位朋友有以下这些文章的pdf文档？
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C. Morgan, “Solutions for Causal Modeling and a Technique for Measuring, Causal, Broadband Dielectric Properties,” DesignCon 2008; r( j5 i+ W# E; K
8 A6 \$ R7 x3 [, i8 n- D% xE. Bogatin, D. DeGroot, C. Warwick, S. Gupta, “Frequency Dependent Material Properties: So What?” 7-TA1, DesignCon 20106 ?$ F$ R8 Q; l1 I( i
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D. Degroot, P. Pupalaikis, B. Shumaker, “Total Loss: How to Qualify Circcuit Boards”, DesignCon 2011
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A. Rajagopal, B. Achkir, M. Koledintseva, A. Koul, J. Drewniak, “Material Parameter Extraction Using Time-Domain TRL (t-TRL) Measurements”, 978-1-4244-4267, IEEE EMC 2009
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A. Horn, J. Reynolds, J. Ratio, “Conductor Profile Effects on the Propagation Constant of Microstrip Transmission Lines”, IEEE IMS 2010& f9 g) y& G! j: r
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H. Barnes, J. Moreira, M. Resso and R. Schaefer, “Advances in ATE Fixture Performance and Socket Characterization for Multi-Gigabit Applications”, DesignCon 2012
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# h/ S/ ]' _3 P: X' ZR. Schaefer, “Comparison of Fixture Removal Techniques for Connector and Cable Measurements” Signal Integrity Workshop, IMS 2010( D4 k/ N% s, j. R) b8 Z
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A.R. Djordjevic, R.M. Biljic, V.D. Likar-Smiljanic, and T.K. Sarkar, “Wideband Frequency-Domain Characterization of FR-4 and Time-Domain Causality,” IEEE Transactions on Electromagnetic Compatibility, vol. 43, no. 4, November 2001
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发表于 2016-4-27 08:48
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发表于 2016-4-28 13:38
