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哪位朋友有以下这些文章的pdf文档?/ y9 S' C& @; R" O1 t+ C P; f
- ]) h8 @. q' v' d+ G( ?: L( x- HC. Morgan, “Solutions for Causal Modeling and a Technique for Measuring, Causal, Broadband Dielectric Properties,” DesignCon 2008
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+ i/ F) \! [ F* d/ x1 q7 ]E. Bogatin, D. DeGroot, C. Warwick, S. Gupta, “Frequency Dependent Material Properties: So What?” 7-TA1, DesignCon 2010/ P, M t' t7 R, y. n& L
1 ]6 P6 v. T! k. yD. Degroot, P. Pupalaikis, B. Shumaker, “Total Loss: How to Qualify Circcuit Boards”, DesignCon 20117 f+ f5 y& j [4 j! x
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' a+ F# G$ W7 j# V: j' X" x2 CA. Rajagopal, B. Achkir, M. Koledintseva, A. Koul, J. Drewniak, “Material Parameter Extraction Using Time-Domain TRL (t-TRL) Measurements”, 978-1-4244-4267, IEEE EMC 20092 R+ `1 E& X j( l2 {5 S
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; L1 y! K3 o1 f$ k1 EA. Horn, J. Reynolds, J. Ratio, “Conductor Profile Effects on the Propagation Constant of Microstrip Transmission Lines”, IEEE IMS 2010
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H. Barnes, J. Moreira, M. Resso and R. Schaefer, “Advances in ATE Fixture Performance and Socket Characterization for Multi-Gigabit Applications”, DesignCon 2012
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3 h! ^( t; p. d& M3 d3 f- [R. Schaefer, “Comparison of Fixture Removal Techniques for Connector and Cable Measurements” Signal Integrity Workshop, IMS 20106 X8 ?5 s: V8 f6 B5 O
! U9 `5 o& E! ]4 [- Y: eA.R. Djordjevic, R.M. Biljic, V.D. Likar-Smiljanic, and T.K. Sarkar, “Wideband Frequency-Domain Characterization of FR-4 and Time-Domain Causality,” IEEE Transactions on Electromagnetic Compatibility, vol. 43, no. 4, November 2001
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