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哪位朋友有以下这些文章的pdf文档?8 T# S, v3 n+ T7 B; E
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C. Morgan, “Solutions for Causal Modeling and a Technique for Measuring, Causal, Broadband Dielectric Properties,” DesignCon 2008
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E. Bogatin, D. DeGroot, C. Warwick, S. Gupta, “Frequency Dependent Material Properties: So What?” 7-TA1, DesignCon 2010
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6 k* g* a: @9 Q. g6 n, }D. Degroot, P. Pupalaikis, B. Shumaker, “Total Loss: How to Qualify Circcuit Boards”, DesignCon 2011+ ?( U! o$ V! a& R
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\8 Y% g. [8 k6 G. f0 \6 y( ZA. Rajagopal, B. Achkir, M. Koledintseva, A. Koul, J. Drewniak, “Material Parameter Extraction Using Time-Domain TRL (t-TRL) Measurements”, 978-1-4244-4267, IEEE EMC 2009
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8 x' s) Q( @" y0 M7 u: sA. Horn, J. Reynolds, J. Ratio, “Conductor Profile Effects on the Propagation Constant of Microstrip Transmission Lines”, IEEE IMS 20102 t" {% j- B# L
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H. Barnes, J. Moreira, M. Resso and R. Schaefer, “Advances in ATE Fixture Performance and Socket Characterization for Multi-Gigabit Applications”, DesignCon 20123 r1 s/ u! G$ C6 p% ]( V& U
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R. Schaefer, “Comparison of Fixture Removal Techniques for Connector and Cable Measurements” Signal Integrity Workshop, IMS 2010
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A.R. Djordjevic, R.M. Biljic, V.D. Likar-Smiljanic, and T.K. Sarkar, “Wideband Frequency-Domain Characterization of FR-4 and Time-Domain Causality,” IEEE Transactions on Electromagnetic Compatibility, vol. 43, no. 4, November 2001) u+ P8 v; V# b ~3 u
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