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哪位朋友有以下这些文章的pdf文档?1 O3 J! K) V$ V. \) R
9 a, h4 G& Y5 \! ]6 n- v8 R, [6 _C. Morgan, “Solutions for Causal Modeling and a Technique for Measuring, Causal, Broadband Dielectric Properties,” DesignCon 2008( `! W- c) K, k8 |( u; V' M
( [* o# m' [' QE. Bogatin, D. DeGroot, C. Warwick, S. Gupta, “Frequency Dependent Material Properties: So What?” 7-TA1, DesignCon 2010
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( o! R, K, H+ U- q |D. Degroot, P. Pupalaikis, B. Shumaker, “Total Loss: How to Qualify Circcuit Boards”, DesignCon 2011
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A. Rajagopal, B. Achkir, M. Koledintseva, A. Koul, J. Drewniak, “Material Parameter Extraction Using Time-Domain TRL (t-TRL) Measurements”, 978-1-4244-4267, IEEE EMC 2009
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A. Horn, J. Reynolds, J. Ratio, “Conductor Profile Effects on the Propagation Constant of Microstrip Transmission Lines”, IEEE IMS 20107 p4 Z2 ?, w5 Q9 A! j% `7 _7 O. p
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: w$ t8 s/ m- W2 _% Z# VH. Barnes, J. Moreira, M. Resso and R. Schaefer, “Advances in ATE Fixture Performance and Socket Characterization for Multi-Gigabit Applications”, DesignCon 2012! x% r1 W: b) d/ O7 J# J
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R. Schaefer, “Comparison of Fixture Removal Techniques for Connector and Cable Measurements” Signal Integrity Workshop, IMS 20108 k& n2 W+ u- k" i" J
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A.R. Djordjevic, R.M. Biljic, V.D. Likar-Smiljanic, and T.K. Sarkar, “Wideband Frequency-Domain Characterization of FR-4 and Time-Domain Causality,” IEEE Transactions on Electromagnetic Compatibility, vol. 43, no. 4, November 2001, T( N# o1 N! I
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