February 2, 2011. A! a, o, K, {/ J; G
* M' @# c `) \# f& zFEBRUARY 2, 2011 -- Anritsu Company introduces a jitter tolerance and 4Tap pre-emphasis solution designed to
test interconnectsup to
28 Gbps (Gbit/s) during DesignCon 2011.
The new offering is designed to meet the
signal-integrity requirementsassociated with designing backplanes for high-speed interconnects, such as Infiniband 26G-IB-EDR, CEI-25G, CEI-28G-VSR, PCI Express, SAS, SATA, FB-DIMM, USB 3.0, and Display Port, enabling engineers to ensure their products meet designated specifications.
At the center of the system is the MP1800A Signal Quality Analyzer (SQA), which is integrated with the MU181500B Jitter
ModulationSource and MP1825B 4Tap Emphasis instrument. The solution generates pre-emphasis signals to conduct
accurate testsand evaluations on high-speed devices, as well as more precise and complete signal integrity analyses up to 28 Gbit/s.
Jitter tolerance testing is supported by transparent output of input data and clock jitter components without attenuation or amplification to ensure accurate, repeatable measurements.
The MP1800A is a modular BERT with a built-in Pulse Pattern Generator (PPG) that supports output of low intrinsic jitter signals; a built-in Error Detector (ED) with high-input sensitivity of 10 mV; and support for signal analyses, including bathtub and Q measurements. The MU181500B module adds precision SJ, RJ, BUJ, and SSC up to 28 Gbit/s to the MP1800A. Adding precision jitter components to the low-jitter, high-quality PPG waveforms supports jitter tolerance testing with high reproducibility and reliability, for easy configuration of tolerance test systems for next-generation CEI-28G-VSR interfaces.
The MP1825B, operating at up to 28
Gb/s, adds four taps for various pre/post-cursors to PPG signals, offering the perfect solution for evaluating the characteristics of printed circuit boards (PCBs), such as backplanes. The four taps can be set as pre- or post-cursors with 20 dB of setting range. The MP1825B allows users to compensate for losses in high-speed data communications channels or to simulate the effects of frequency-dependent loss in those channels.
, R/ B2 n* M9 ?- u' {& C& l# \/ r8 t